Product Overview
Indium Gallium Zinc Oxide IGZO Evaporation Materials is a conductive-oxide evaporation source used in transparent or semiconducting functional-film research. For oxide evaporation, the source can experience oxygen loss or composition change during heating, so the deposited film may not exactly reproduce the bulk source composition. Electron-beam evaporation, controlled oxygen background, source conditioning, and post-deposition treatment are among the process variables commonly evaluated when optimizing electrical and optical performance.
Evaporation Behavior and Process Considerations
Electron-beam evaporation is frequently evaluated for ceramic oxides because many have high melting temperatures. During heating, oxygen can be lost or the source can partially dissociate, so oxygen partial pressure, substrate temperature, deposition rate, and any post-deposition anneal may need optimization. The source should be conditioned gradually to minimize cracking, spitting, and sudden outgassing.
Technical Data
| Material Type | Indium Gallium Zinc Oxide |
| Symbol | IGZO |
| Color/Appearance | White Solid |
| Melting Point | 850 °C |
| Theoretical Density | 6.5 g/cm3 |
| Purity | 99.5% ~ 99.99% |
| Shape | Powder/ Granule/ Custom-made |
Typical Thin-Film Applications
- Optical, dielectric, transparent conductive, magnetic, protective, or functional oxide films
- Displays, photovoltaics, sensors, semiconductors, and multilayer optical coatings where applicable
- Research on composition, oxygen content, phase, and post-deposition treatment
Source Form and Ordering Considerations
For quotation, provide the material or formula, purity, desired source form and size, quantity, evaporation method if known, and any crucible, boat, or e-beam hearth constraints. For compound materials, include the target film composition or application when possible so that source form and process risk can be reviewed together. TFM can supply pellets, pieces, granules, tablets, or other custom forms subject to material manufacturability.
Frequently Asked Questions
Is Indium Gallium Zinc Oxide IGZO commonly evaporated by electron beam?
Electron-beam evaporation is frequently evaluated for high-melting ceramic oxides because it can provide localized heating. The exact method depends on the oxide, source form, and required film properties.
Can Indium Gallium Zinc Oxide IGZO lose oxygen during evaporation?
Yes. Some oxides can partially dissociate or become oxygen-deficient under vacuum heating. Oxygen partial pressure, substrate temperature, deposition rate, and post-annealing can influence the final film composition.
Why can oxide evaporation sources spit or crack?
Rapid heating, trapped gas, porosity, and thermal gradients can cause cracking or particle ejection. A gradual conditioning ramp and stable source geometry help reduce these effects.
Does the deposited film always match the composition of Indium Gallium Zinc Oxide IGZO?
Not always. Preferential evaporation, oxygen loss, decomposition, and substrate conditions can shift film chemistry or phase relative to the source material.
What source form is suitable for Indium Gallium Zinc Oxide IGZO?
Pellets, tablets, pieces, or granules may be used depending on the e-beam pocket or crucible. A dense and mechanically stable source form is usually easier to condition reproducibly.
What information should I provide for a Indium Gallium Zinc Oxide IGZO quotation?
Provide formula or composition, purity, source form and size, quantity, evaporation method, source-holder dimensions, and any film-composition or documentation requirements.

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