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ST0264 Molybdenum Disilicide Sputtering Target, MoSi2

Chemical Formula: MoSi2
Catalog Number: ST0264
CAS Number: 12136-78-6
Purity: >99.5%
Shape: Discs, Plates, Column Targets, Step Targets, Custom-made

Molybdenum Disilicide sputtering target  come in various forms, purities, sizes, and prices. Thin Film Materials (TFM) manufactures and supplies top-quality sputtering targets at competitive prices.

Introduction

The Molybdenum Disilicide Sputtering Target (MoSi₂) is a high-performance ceramic compound target widely used in thin film deposition for applications requiring excellent thermal stability, oxidation resistance, and electrical conductivity. MoSi₂ is a well-known refractory silicide material that combines the high-temperature durability of molybdenum with the chemical stability of silicon-based compounds.

MoSi₂ thin films deposited through magnetron sputtering or other physical vapor deposition (PVD) techniques are commonly used in semiconductor devices, diffusion barrier layers, high-temperature coatings, and microelectronic components. Its ability to maintain structural integrity and resist oxidation at elevated temperatures makes it particularly valuable for demanding industrial and research applications.

Detailed Description

Molybdenum Disilicide sputtering targets are typically manufactured using high-purity molybdenum and silicon through advanced ceramic processing techniques such as hot pressing, vacuum sintering, or hot isostatic pressing (HIP). These processes produce dense, homogeneous targets with controlled stoichiometry, which is essential for stable sputtering performance and uniform thin film deposition.

MoSi₂ is a refractory intermetallic compound with a melting point exceeding 2000 °C and excellent resistance to oxidation at high temperatures. When exposed to oxygen at elevated temperatures, MoSi₂ forms a protective silicon dioxide (SiO₂) layer on its surface, which helps prevent further oxidation and improves long-term durability.

In thin film applications, MoSi₂ coatings provide excellent thermal stability, electrical conductivity, and diffusion barrier performance. These characteristics make MoSi₂ films suitable for microelectronic device structures where stable conductive layers and high-temperature reliability are required.

High-density MoSi₂ sputtering targets help ensure stable sputtering rates, reduced particle generation, and improved film uniformity. For high-power sputtering systems, MoSi₂ targets can be supplied as bonded targets with copper backing plates, typically using indium bonding or diffusion bonding techniques to improve heat transfer and mechanical stability during operation.

Applications

Molybdenum Disilicide sputtering targets are widely used in several advanced technology sectors:

  • Semiconductor thin films used in integrated circuits and microelectronics

  • Diffusion barrier layers in electronic devices and metallization structures

  • High-temperature protective coatings for aerospace and industrial systems

  • Microelectromechanical systems (MEMS) requiring stable conductive layers

  • Thin film heating elements used in high-temperature sensors and devices

  • Research laboratories investigating refractory silicide materials

Technical Parameters

ParameterTypical Value / RangeImportance
Purity99.5% – 99.9%Higher purity ensures stable film properties
Chemical FormulaMoSi₂Determines compound structure and electrical behavior
Diameter25 – 300 mm (custom)Compatible with standard sputtering systems
Thickness3 – 6 mmInfluences sputtering efficiency and target lifespan
Density≥ 95% theoretical densityEnsures uniform deposition and stable sputtering
BondingCopper backing plate / Indium bondedImproves heat transfer during high-power sputtering

Comparison with Related Materials

MaterialKey AdvantageTypical Application
Molybdenum Disilicide (MoSi₂)High-temperature stability and oxidation resistanceSemiconductor diffusion barriers and coatings
Molybdenum (Mo)Excellent electrical and thermal conductivitySemiconductor metallization layers
Tungsten Silicide (WSi₂)Good thermal stability in semiconductor processesGate electrodes and barrier layers

FAQ

QuestionAnswer
What sputtering methods are compatible with MoSi₂ targets?MoSi₂ sputtering targets are commonly used in RF magnetron sputtering and other PVD deposition systems suitable for ceramic materials.
Can the target size be customized?Yes. Diameter, thickness, and bonding configurations can be tailored to match different sputtering systems.
Are bonded sputtering targets available?Yes. MoSi₂ targets can be bonded to copper backing plates using indium bonding to improve thermal management.
What purity levels are typically available?Standard purity levels range from 99.5% to 99.9%.
What substrates can MoSi₂ thin films be deposited on?MoSi₂ films can be deposited on silicon wafers, glass, ceramics, and various metallic substrates.

Packaging

Our Molybdenum Disilicide Sputtering Target (MoSi₂) products are meticulously tagged and labeled externally to ensure efficient identification and maintain strict quality control standards. Each target is carefully packaged in vacuum-sealed bags with protective foam and export-grade cartons or wooden crates to prevent contamination, oxidation, and mechanical damage during storage and transportation.

Conclusion

The Molybdenum Disilicide Sputtering Target (MoSi₂) provides a reliable solution for producing high-performance thin films used in semiconductor devices, high-temperature coatings, and advanced materials research. Its excellent oxidation resistance, thermal stability, and electrical conductivity make it an important material for demanding deposition environments.

With customizable dimensions, high-density manufacturing, and stable sputtering performance, MoSi₂ sputtering targets support both industrial thin film production and cutting-edge research applications.

For detailed specifications and a quotation, please contact us at sales@thinfilmmaterials.com.

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FAQ

It’s the source material (in solid form) used in sputter deposition to eject atoms or molecules that then form a thin film on a substrate.

Targets can be pure metals (e.g., gold, copper, aluminum), ceramics (e.g., Al₂O₃, SiO₂, TiO₂), alloys, or composites—chosen based on the film’s desired properties.

 

They are produced by processes such as melting/casting for metals or sintering (often with hot isostatic pressing) for ceramics and composite targets to ensure high density and purity.

 

In a vacuum chamber, a plasma (typically argon) bombards the target, ejecting atoms that travel and condense on a substrate, forming a thin film.

 

Key factors include the target’s purity, density, grain structure, and the sputtering yield (i.e. how many atoms are ejected per incident ion), as well as operating conditions like power density and gas pressure.

 

Operators monitor target erosion (often by measuring the depth of the eroded “race track”) or track total energy delivered (kilowatt-hours) until it reaches a threshold that can compromise film quality.

 

Fragile materials (such as many ceramics or certain oxides) and precious metals often require a backing plate to improve cooling, mechanical stability, and to allow thinner targets that reduce material costs.

 

DC sputtering is used for conductive targets, while RF sputtering is necessary for insulating targets (like many oxides) because it prevents charge buildup on the target’s surface.

 

In reactive sputtering, a reactive gas (e.g., oxygen or nitrogen) is introduced to form compound films on the substrate, but it may also “poison” the target surface if not carefully controlled.

 

Many manufacturers prefer to control raw material quality by sourcing their own powders; using external powders can risk impurities and inconsistent target properties.

 

Targets should be stored in clean, dry conditions (often in original packaging or re-wrapped in protective materials) and handled with gloves to avoid contamination, ensuring optimal performance during deposition.

Deposition rate depends on factors such as target material and composition, power density, working gas pressure, substrate distance, and the configuration of the sputtering system (e.g., magnetron design).

 
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