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Lanthanum Strontium Copper Oxide Sputtering Target

Material TypeLanthanum Strontium Copper Oxide
SymbolLa(1-x)SrxCuO4
Color/AppearanceVarious colors, Solid
Melting Point (°C)N/A
Relative Density (g/cc)>90%
Z RatioN/A
SputterRF, RF-R, DC
Max Power Density*
(Watts/Square Inch)
N/A
Type of BondIndium, Elastomer

Lanthanum Strontium Copper Oxide Sputtering Targets

Applications

Lanthanum Strontium Copper Oxide (LSCO) sputtering targets are primarily used in the fabrication of thin films for various advanced electronic applications. These include:

  • Ferroelectric Materials
  • Gate Dielectrics
  • For CMOS Devices

Features

  • High Purity: Ensures consistent film quality and superior performance in critical applications.
  • Custom Sizes Available: Tailored to meet the precise needs of your project.

Manufacturing Process

  • Cold Pressing & Sintering: Targets are manufactured using cold pressing and sintering techniques to achieve optimal density and material integrity.
  • Elastomer Bonding: Elastomer bonding to the backing plate ensures stability during sputtering processes.
  • Cleaning & Final Packaging: Targets are thoroughly cleaned for vacuum use and packaged with protection from environmental contaminants to ensure quality during shipment.

Options Available

  • Purity: 99.9% minimum purity for high-performance results.
  • Smaller Sizes for R&D: Custom sizes available for research and development applications.
  • Sputtering Target Bonding Service: Available for enhanced target stability and performance.

For more information or to inquire about specific requirements, please contact us.

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FAQ

It’s the source material (in solid form) used in sputter deposition to eject atoms or molecules that then form a thin film on a substrate.

Targets can be pure metals (e.g., gold, copper, aluminum), ceramics (e.g., Al₂O₃, SiO₂, TiO₂), alloys, or composites—chosen based on the film’s desired properties.

 

They are produced by processes such as melting/casting for metals or sintering (often with hot isostatic pressing) for ceramics and composite targets to ensure high density and purity.

 

In a vacuum chamber, a plasma (typically argon) bombards the target, ejecting atoms that travel and condense on a substrate, forming a thin film.

 

Key factors include the target’s purity, density, grain structure, and the sputtering yield (i.e. how many atoms are ejected per incident ion), as well as operating conditions like power density and gas pressure.

 

Operators monitor target erosion (often by measuring the depth of the eroded “race track”) or track total energy delivered (kilowatt-hours) until it reaches a threshold that can compromise film quality.

 

Fragile materials (such as many ceramics or certain oxides) and precious metals often require a backing plate to improve cooling, mechanical stability, and to allow thinner targets that reduce material costs.

 

DC sputtering is used for conductive targets, while RF sputtering is necessary for insulating targets (like many oxides) because it prevents charge buildup on the target’s surface.

 

In reactive sputtering, a reactive gas (e.g., oxygen or nitrogen) is introduced to form compound films on the substrate, but it may also “poison” the target surface if not carefully controlled.

 

Many manufacturers prefer to control raw material quality by sourcing their own powders; using external powders can risk impurities and inconsistent target properties.

 

Targets should be stored in clean, dry conditions (often in original packaging or re-wrapped in protective materials) and handled with gloves to avoid contamination, ensuring optimal performance during deposition.

Deposition rate depends on factors such as target material and composition, power density, working gas pressure, substrate distance, and the configuration of the sputtering system (e.g., magnetron design).

 
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