MSDS File
Product Overview
Lead Lanthanum Zirconium Titanate (PLZT (Pb1-xLax(ZryTi1-y)1-0.25xO3) Evaporation Materials) is a ceramic evaporation material for depositing oxide thin films used in optical, dielectric, electronic, magnetic, protective, or research applications. Many oxides have high melting temperatures and can partially dissociate or lose oxygen during evaporation, making electron-beam evaporation a common process option. Source density, pellet or piece geometry, crucible compatibility, oxygen background, deposition rate, and substrate conditions can all affect film stoichiometry and microstructure.
Evaporation Behavior and Process Considerations
Electron-beam evaporation is frequently evaluated for ceramic oxides because many have high melting temperatures. During heating, oxygen can be lost or the source can partially dissociate, so oxygen partial pressure, substrate temperature, deposition rate, and any post-deposition anneal may need optimization. The source should be conditioned gradually to minimize cracking, spitting, and sudden outgassing.
Technical Data
| Parameter | Typical Value / Range | Importance |
|---|---|---|
| Chemical Formula | Pb₁₋ₓLaₓ(ZrᵧTi₁₋ᵧ)₁₋₀.₂₅ₓO₃ | Defines ferroelectric properties |
| La Content (x) | 0.02 – 0.12 (customizable) | Tunes dielectric & optical response |
| Zr/Ti Ratio (y) | 0.40 – 0.70 (customizable) | Controls phase & polarization |
| Purity | 99.9% – 99.99% (metal basis) | Ensures film uniformity |
| Form | Pellets / Granules / Pieces | Compatible with evaporation systems |
| Density | ≥ 95% theoretical density | Stable evaporation behavior |
| Evaporation Method | E-beam / Resistive | Deposition flexibility |
| Material | Key Advantage | Typical Application |
|---|---|---|
| PLZT | Optical transparency + ferroelectricity | Electro-optic devices |
| PZT | Strong piezoelectric response | Actuators & sensors |
| BaTiO₃ | Lead-free dielectric material | Capacitors |
| LiNbO₃ | High electro-optic coefficient | Photonic modulators |
| Question | Answer |
|---|---|
| Can composition be customized? | Yes, both La content and Zr/Ti ratio can be tailored according to application requirements. |
| Is lead volatility considered during evaporation? | Yes, compositions are optimized to compensate for potential lead loss during deposition. |
| What evaporation methods are supported? | Suitable for electron beam and resistive heating evaporation. |
| Can you provide small research quantities? | Yes, flexible quantities are available for R&D applications. |
| How is the material packaged? | Vacuum-sealed packaging with protective cushioning ensures safe transport. |
Typical Thin-Film Applications
- Optical, dielectric, transparent conductive, magnetic, protective, or functional oxide films
- Displays, photovoltaics, sensors, semiconductors, and multilayer optical coatings where applicable
- Research on composition, oxygen content, phase, and post-deposition treatment
Source Form and Ordering Considerations
For quotation, provide the material or formula, purity, desired source form and size, quantity, evaporation method if known, and any crucible, boat, or e-beam hearth constraints. For compound materials, include the target film composition or application when possible so that source form and process risk can be reviewed together. TFM can supply pellets, pieces, granules, tablets, or other custom forms subject to material manufacturability.
Frequently Asked Questions
Is Lead Lanthanum Zirconium Titanate (PLZT commonly evaporated by electron beam?
Electron-beam evaporation is frequently evaluated for high-melting ceramic oxides because it can provide localized heating. The exact method depends on the oxide, source form, and required film properties.
Can Lead Lanthanum Zirconium Titanate (PLZT lose oxygen during evaporation?
Yes. Some oxides can partially dissociate or become oxygen-deficient under vacuum heating. Oxygen partial pressure, substrate temperature, deposition rate, and post-annealing can influence the final film composition.
Why can oxide evaporation sources spit or crack?
Rapid heating, trapped gas, porosity, and thermal gradients can cause cracking or particle ejection. A gradual conditioning ramp and stable source geometry help reduce these effects.
Does the deposited film always match the composition of Pb1-xLax(ZryTi1-y)1-0.25xO3) Evaporation Materials?
Not always. Preferential evaporation, oxygen loss, decomposition, and substrate conditions can shift film chemistry or phase relative to the source material.
What source form is suitable for Lead Lanthanum Zirconium Titanate (PLZT?
Pellets, tablets, pieces, or granules may be used depending on the e-beam pocket or crucible. A dense and mechanically stable source form is usually easier to condition reproducibly.
What information should I provide for a Lead Lanthanum Zirconium Titanate (PLZT quotation?
Provide formula or composition, purity, source form and size, quantity, evaporation method, source-holder dimensions, and any film-composition or documentation requirements.
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